New electron source for electron microscopy

Release date: 2010-09-25


Recently, researchers at the Japan Institute of Materials Research have developed a new type of electron source, which is expected to greatly improve the recognition and measurement capabilities of electron microscopes.
According to reports, the development of this new type of electron source is the two Chinese scientists of the Japanese material materials organization, Tang Jie, researcher of the primary material group, and Zhang Han, a researcher. In order to greatly improve the performance of the electron microscope, they focused on the development of new electron sources and also innovated in the field of electron emission methods.
At present, electron microscopy generally uses tungsten as the electron source, while the compound lanthanum hexaboride (LaB6), as an electron source, exceeds tungsten in performance, but its hardness is more than double that of tungsten. It is difficult to achieve without proper processing methods. application. The researchers used a method called chemical vapor deposition, which first produced a single-crystal lanthanum hexaboride nanowire, and then removed the impurities on the surface of the nanowire by evaporation. A new type of electron source has emerged. Compared with the conventional method of heating a heat source at a high temperature to emit hot electrons, the new electron source uses an electric radiation method in which an ultrafine electron beam is emitted at an extremely high luminance.
In the field of electron microscopy, Japan has been leading the world in the past. Transmission electron microscopy and scanning electron microscopy have also been important export products for Japan, but Japan has been surpassed by the United States and Germany in this field. Researchers say that some time ago, Japan has developed a new high-performance lens. If it is equipped with the successful development of a single-crystal nanowire electric radiation source, it will hopefully regain the world of transmissive electron microscopy. leading position.

Source: Technology Daily

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